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[International Journal] Influence of the charge trap density distribution in a gate insulator on the positive-bias stress instability of amorphous indium-gallium-zinc oxide thin-film transistors
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Eungtaek Kim, Choong-Ki Kim, Myung Keun Lee, Tewook Bang, Yang-Kyu Choi, Sang-Hee Ko Park, Kyung Cheol Choi

Applied Physics Letters, May , 2016

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Abstract