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[International Journal] Highly Stable 2D Material (2DM) Field-Effect-Transistors (FETs) with Wafer-Scale Multi-dyad Encapsulation

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Choong-Ki Kim+, Eun Gyo Jeong+, Eungtaek Kim, Jeong-Gyu Song, Youngjun Kim, Whang Je Woo, Myung Keun Lee, Hagyoul Bae, Seung-Bae Jeon, Hyungjun Kim, Kyung Cheol Choi, Yang-Kyu Choi

Nanotechnology, December , 2016

http://iopscience.iop.org/article/10.1088/1361-6528/aa5235/meta;jsessionid=E5A9115E6CAC132D4ED64D421F87FD57.c2.iopscience.cld.iop.org

http://iopscience.iop.org/article/10.1088/1361-6528/aa5235/pdf

Published

vol 28, no 5, pp 055203

Abstract