Journal

> Publication > Journal

[International Journal] Highly Stable 2D Material (2DM) Field-Effect-Transistors (FETs) with Wafer-Scale Multi-dyad Encapsulation
Hit : 448

Choong-Ki Kim+, Eun Gyo Jeong+, Eungtaek Kim, Jeong-Gyu Song, Youngjun Kim, Whang Je Woo, Myung Keun Lee, Hagyoul Bae, Seung-Bae Jeon, Hyungjun Kim, Kyung Cheol Choi, Yang-Kyu Choi

Nanotechnology, December , 2016

Published

vol 28, no 5, pp 055203

Abstract